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RTS-4

Features

  • Tracing Test System for COF
  • Detect Fine Pattern Open/Short test by using the tracing probe
  • Big reduction of running cost
    it is not necessary to make an expensive fixture.

Specification

  • Applicable Work Size: 35/48/70/105/120/156/158mm Width
    ※Depend on the Custimer request
  • Number of Test Head: 4Head(Line&Space=11μ/11μ)
  • EQ Dimension/Weight: 3800(W)×1400(D)×2350(H)mm / 1690kg

AHD-GS

Features

  • Direct Connection Type Tester Unit
  • High Inspection Speed & High Accuracy Test
  • By the micro-short test function,test-object does not suffer damage at high voltage input
  • Optional Tests:Micro-short test,Burn-out test and 4-wire test

Specification

  • Applicable PCB Size: 60(W)×50(D)～260(W)×200(D)mm
    Thickness: 0.3～2.0mm
  • Number of Test Points: QD:16384points(Top:8192/Bottom:8192points)
  • EQ Dimension/Weight: 3300(W)×2300(D)×22330(H)mm / Approx: 6500kg

AIX-5000

Features

  • Direct Connection Type Tester Unit
  • High Inspection Speed&High Accuracy Test
  • By the micro-short test function,test-object does not suffer damage at high voltage input
  • Optional Tests: Micro-short test,Burn-out test and 4-wire test

Specification

  • Max Pin No: 16384Pin(Upper:8192pin/Lower:8192pin)
  • Input Voltage: 5V to 250V
  • Open Test
    Input Voltage: 5V to 250V
    Input Current: Max.25mA
    Resistance Measurement Range: 1Ω to 500KΩ
  • Leak Test
    Input Voltage: 5V to 250V
    Input Current: Max.5mA
    Resistance Measurement Range: 10kΩ to 200MΩ
  • Micro Short Test
    Input Voltage: 5V to 250V
    Input Current: Max.100μA
    Resistance Measurement Range: 100kΩ
  • Option Test: Burn-out test,4-wire test

AiCt -ZR series （Almighty Circuit System）

It's a remarkable test system with the almighty function by 1 Tester.

Inspection・Measurement items

  • Standard Inspection
  • μΩ・ｍΩ Measurement
  • ＬＣＲ Measurement
  • Assembled Open Short Inspectionｎ
  • In circuit Inspection
  • Burn in board Inspection
  • Function Inspection

AiCt-ZR LCR 4K


  • 2K Unit or 4K Unit selectable
  • It’s possible to Min128pin up to Max 32,768pin(注1),(注2)
  • It is possible to inspect for Multi-Pin、Low Voltage：Low resistance～High resistance、High Voltage：Low resistance～High resistance
  • Various measurement inspection are possible to combine.
(注1)   
  
  
(注2)  
   
  
  
  
It is selectable for 4K system (Min 128 pin～Max 32,768 pin) and 2K system
(Min 128 pin～Max 16,384 pin) of Open, Leak inspection and standard inspection
and disassemble circuit board of μΩand ｍΩ inspection.
It is selectable for 4K system (Min 128 pin～Max 16,384 pin) and 2K system
(Min 128 pin～Max 8,192 pin)of Assembled circuit board for Open Short inspection system,
DC measurement inspection sysmte, ACmeasurement inspection system, Burn in board
inspection system and stand alone function inspection system.


Chip On Circuit Tester

Aift-DOL





This tester can be tested for the connection and insulation after mounting of IC chip and Diode forward direction Test of IC chip inside.




Chip On Aging Test System for COF/TCP


This system can be combined Chip On Circuit Tester or Function Tester with Environmental Test System.


Standard Aging System

Combination with Chip on Circuit Tester

Standard Aging System

Combination with Function Tester